Publikation

  • Likotiko, E.; Petrov, D.; Mwangoka, J.; Hilleringmann, U.: Real time solid waste monitoring using cloud and sensors technologies. In: The Online Journal of Science 2018, 106-116, 2018
  • Vollbrecht, J.; Oechsle, P.; Stepen, A.; Hoffmann, F; Paradies, J.; Meyers, T.; Hilleringmann, U.; Schmidtke, J; Kitzerow, H.: Liquid crystalline dithienothiophene derivatives for organic electronics, Organic Electronics, Vol. 61, pp. 266-275, 2018,
  • Meyers, T.; Reker, J.; Vidor, F. F.; Hilleringmann, U.: Deposition methods for C8-BTBT in flexible TFTs. In: Smart Systems Integration 2018, 11.-12. Apr. 2018, Dresden, Germany, pp. 442-445, ISBN 978-3-95735-082-4
  • Reker, J.; Meyers, T.; Vidor, F. F.; Hilleringmann, U.: Deposition speed optimization for ZnO nanoparticle TFTs using doctor blade process. In: Smart Systems Integration 2018, 11.-12. Apr. 2018, Dresden, Germany, pp. 472-475, ISBN 978-3-95735-082-4
  • Geneiß, T. Lüke, C. Hedayat, M. Wolf, F. Janek, T. Meißner, M. Barth, W. Eberhardt, A. Zimmermann, T. Otto: Impedance-Controlled Design and Connection Technology for Micromounting and Hybrid Integration of High-Frequency and Mixed- Signal Systems with MID Technology. In: Smart System Integration – International Conference and Exhibition on Integration Issues of Miniaturized Systems; 2018; ISBN: 978-3-95735-082-4
  • Hangmann, C., Hedayat, C., Hilleringmann, U., Otto, T.: Stochastic Analyzes and Monte-Carlo Simulations of nonlinear and non-ideal Mixed-Signal Phase-Locked Loops. In: Smart System Integration – International Conference and Exhibition on Integration Issues of Miniaturized Systems; 2018; ISBN: 978-3-95735-082-4
  • Drude, D.; Schönhoff, M.; Hilleringmann, U.; Modular thermoelectric generator for universal waste heat recovery, IDTechEx Europe, Berlin, Germany, 2018 April 11-12
  • Meyers, T.; Reker, J.; Vidor, F. F.; Schirmer, M.; Mai, T.; Gerngroß, M.; Kaiser, C.; Hilleringmann, U; Characterization of an amorphous perfluorinated copolymer as dielectric for flexible electronics. In: The 44th International Conference on Micro and Nano Engineering (MNE2018), 24.-27. Sep. 2018, Copenhagen, Denmark
  • Reker, J.; Meyers, T.; Vidor, F. F.; Hilleringmann, U.; Inverter circuits in complementary technology using inorganic nanoparticle-based TFTs. In: 2018 Fall Meeting European Materials Research Society (E-MRS), 17.-20. Sep. 2018, Warsaw, Poland
  • Meyers, T.; Reker, J.; Temme, J.; Vidor, F. F.; Hilleringmann, U.; Self-aligned organic thin-film transistors for flexible electronics. In: 5th SMEOS Conference, 8.-10. Oct. 2018, Skukuza, South Africa
  • Meyers, T.; Reker, J..; Vidor, F. F.; Vollbrecht, J.; Kitzerow, H.; Paradies, J. Hilleringmann, U.; Improved organic thin-film transistor performance by dielectric layer patterning. In: 5th SMEOS Conference, 8.-10. Oct. 2018, Skukuza, South Africa
  • Reker, J.; Meyers, T.; Vidor, F. F.; Hilleringmann, U.; Inorganic p-channel thin-film transistors using CuO nanoparticles. In: 5th SMEOS Conference, 8.-10. Oct. 2018, Skukuza, South Africa
  • Hilleringmann, U.; Reker, J.; Vidor, F.F.; Meyers, T.; Bezuidenhout, P.H.; Joubert, T.-H.; Nanoparticles and Organic Semiconductors for Flexible Electronics. In: 5th SMEOS Conference, 8.-10. Oct. 2018, Skukuza, South Africa
  • Vidor, F. F.; Meyers, T.; Reker, J.; Müller, K.; Wirth, G. I.; Hilleringmann, U.; Mechanical deformation on nanoparticle-based thin-film transistors. In: 5th SMEOS Conference, 8.-10. Oct. 2018, Skukuza, South Africa
  • Petrov, D.; Meyers, T.; Reker, J.; Hilleringmann, U.; Doctor blade system for the deposition of thin semiconducting films. In: 5th SMEOS Conference, 8.-10. Oct. 2018, Skukuza, South Africa
  • Schwabe, T.; Balke, A.; Bezuidenhout, P.H.; Reker, J.; Meyers, T.; Joubert, T.-H.; Hilleringmann, U.; Oxygen detection with zinc oxide nanoparticle structures. In: 5th SMEOS Conference, 8.-10. Oct. 2018, Skukuza, South Africa
  • Meyers, T.; Reker, J.; Petrov, D.; Vidor, F. F.; Hilleringmann, U.; Influence of the electrode material on the performance of BTBT-based thin-film transistors. In: 7. GMM Workshop Mikro-Nano-Integration, 22.-23. Oct. 2018, Dortmund, Germany
  • Reker, J.; Meyers, T.; Petrov, D.; Vidor, F. F.; Hilleringmann, U.; Performance analysis of CuO nanoparticle-based thin-film transistors. In: 7. GMM Workshop Mikro-Nano-Integration, 22.-23. Oct. 2018, Dortmund, German
  • Petrov, D.; Narayan, R.S.; Hilleringmann, U.; Portable Sensor System for UV-Irradiation Measurements, Smart Systems Integration 2018 – International Conference and Exhibition on Integration Issues of Miniaturized Systems, SSI 2018, pp. 468-471, ISBN 978-3-95735-082-
  • Becker, T. E.; Vidor, F. F.; Wirth, G. I.; Meyers, T.; Reker, J.; Hilleringmann, U.: Time Domain Electrical Characterization in Zinc Oxide Nanoparticle Thin-Film Transistors. In: 2018 IEEE 19th Latin-American Test Symposium (LATS), 12.-14. März 2018, Sao Paulo, Brazil
  • Schmidt, M.; Metz, G.; Hedayat, C.; Otto, T.; Petrov, D.; RFID Units for a Product Based Control of Industrial Production Systems, Smart Systems Integration 2018 – International Conference and Exhibition on Integration Issues of Miniaturized Systems, SSI 2018, pp. 484-487, ISBN 978-3-95735-082-4
  • Meyers, T.; Vollbrecht, J.; Vidor, F. F.; Reker, J.; Kitzerow, H.-S.; Hilleringmann, U.: Organische Dünnschichttransistoren für AMOLED-Applikationen. In: 7. MikroSystemTechnik Kongress, 23.-25. Oktober 2017, München, Deutschland.
  • Meyers, T.; Vidor, F.F.; Reker, J.; Hilleringmann, U.; Performance enhancement techniques for flexible electronics, IDTechEx Europe, Berlin, Germany, 2017 May 10-11
  • Vidor, F. F.; Meyers, T.; Reker, J.; Wirth, G. I.; Hilleringmann, U.: Self-aligned ZnO nanoparticle-based TFTs for flexible electronics. In: 13th IEEE Africon 2017, 18.-20. September 2017, Kapstadt, Südafrika.
  • Schönhoff, M.; Hilleringmann, U.; De Boor, J.: Mass Production of Magnesium Silicide as a TEG Material, IEEE Africon 2017 Proceedings, S. 1009-1013.
  • Reker, J.; Meyers, T.; Vidor, F. F.; Hilleringmann, U.: Deposition of ZnO nanoparticles for thin-film transistors by doctor blade process. In: 13th IEEE Africon 2017, 18.-20. September 2017, Kapstadt, Südafrika.
  • Reker, J.; Meyers, T.; Vidor, F. F.; Hilleringmann, U.: Integrationstechnik für ZnO-Nanopartikel-Dünnschichttransistoren. In: 7. MikroSystemTechnik Kongress, 23.-25. Oktober 2017, München, Deutschland.
  • Meyers, T.; Vollbrecht, J.; Vidor, F. F.; Reker, J.; Kitzerow, H.-S.; Hilleringmann, U.: Organic Thin-Film Transistors for AMOLED Applications. In: 7. MikroSystemTechnik Kongress, 23.-25. Oktober 2017, München, Deutschland.
  • Likotiko, E.; Petrov, D.; Mwangoka, J.; Hilleringmann, U.: REAL TIME SOLID WASTE MONITORING USING CLOUD AND SENSORS TECHNOLOGIES, Proceedings International Science and Technology Conference, ISSN:2146-7382, 2017, S. 441-450
  • Hilleringmann, U.: Halbleitende Nanopartikel für Feldeffekttransistoren, in: Nanotechnologie und Nanoprozesse, 2. Auflage, Springer-Verlag, Hrsg. W. R. Fahrner, 2017, S. 290 – 296
  • Hilleringmann, U.: Ätzung von Nanostrukturen, in: Nanotechnologie und Nanoprozesse, 2. Auflage, Springer-Verlag, Hrsg. W. R. Fahrner, 2017, S. 174 – 197
  • Hett, T.; Krämmer, S.; Hilleringmann, U.; Kalt, H.; Zrenner, A.; High-Q whispering gallery microdisk resonators based on silicon oxynitride, Journal of Luminescence, vol. 191, pp. 131-134, ISSN 0022-2313.
  • Hangmann,C.; Hedayat,C.; Lüke,T.; Hilleringmann, U.: Improved RF Design Using a Combination of Precise 3D Near-Field Measurements and CST Simulations, CST European User Conference, 2017.
  • Hilleringmann, U.; Horstmann, J.T.; Job, R.: Erweiterung konventioneller Bauelemente durch Nanotechniken, in: Nanotechnologie und Nanoprozesse, 2. Auflage, Springer-Verlag, Hrsg. W. R. Fahrner, 2017, S. 245 – 258
  • Schönhoff, M.; Hilleringmann, U.; TEGs as self-sufficient power supply for sensors and microelectromechanical systems, SPIE Digital Library as part of the proceedings of the Fourth Conference on Sensors, doi: 10.1117/12.2243133
  • Hilleringmann, U.; Vidor F. F.; Meyers T.; Complementary field-effect transistors for flexible electronics, Proc. SPIE 10036, Fourth Conference on Sensors, MEMS, and Electro-Optic Systems, 100360K, 2017
  • Meyers, T.; Vidor, F.F.; Brassat, K.; Lindner, J.K.N; Hilleringmann, U.; Low-voltage DNTT based thin-film transistors and inverters for flexible electronics, Microelectronic Engineering, Vol. 174, pp. 35-39, 2017
  • Vidor, F.F.; Meyers, T.; Hilleringmann, U.; Integration of ZnO nanoparticle transistor on freestanding flexible substrates, Proc. SPIE 10036, Fourth Conference on Sensors, MEMS, and Electro-Optic Systems, 100360A, 2017
  • Meyers, T.; Vidor, F. F.; Reker, J.; Brockschmidt, T.; Wirth, G. I.; Hilleringmann, U; Electric field-assisted performance improvement of solution-processed organic thin-film transistors. In: The 43th International Conference on Micro and Nano Engineering (MNE2017), 18.-22. 2017, Braga, Portugal
  • K. T. Kallis, V. V. Vendt, C. Küchenmeister, H. L. Fiedler
    „Preparation of nanoscale thermal time of flight sensors by e-beam lithography”,
    In: Microelectronic Engineering, Volume 97 (Sept. 2012,) S. 357-360
  • C. M. Zimmer, M. Kieschnick, K. T. Kallis, J. Schubert, U. Kunze and T.Doll „Nano photoelectron ioniser chip using LaB6 for ambient pressure trace gas detection”, In: Microelectronic Engineering, Volume 98 (Oct. 2012), S. 472-476
  • U. Künzelmann, M. R. Müller, K. T. Kallis, F. Schütte, S. Menzel, S. Engels, J. Fong, C. Lin, J. Dysard, J.W. Bartha and J. Knoch
    „Chemical-Mechanical Planarization of Aluminium Damascene Structures“,
    Int. Conference on Planarization/CMP Technology (ICPT 2012), Proceedings, pp. 371-376
  • F. Hoffmann, A. Loechte, G. Rebel, C. Krimphove, P. Glösekötter:
    Degradation aware energy storage using hybrid capacitors, published at 2nd IEEE
    ENERGYCON Conference & Exhibition, 2012, pp 60, ISBN 978-1-4673-1452-7,
    September 9-12 2012, Florence, Italy
  • C. Krimphove, F. Hoffmann, G. Rebel, P. Glösekötter:
    Wearout-Free Oxygen Sensor, published and awarded with the Bronze Leaf Certificate at the 8th Conference on Ph.D. Research in Microelectronics & Electronics, pp 339, ISBN 978-3-8007-3442-9, 12 – 15 Juni 2012, Aachen, Germany
  • K. T. Kallis, J. T. Horstmann and H. L. Fiedler, „Parameter fluctuations in multiple patterned deca-nm scaled CMOS structures“, In: Journal of Nano Research , Vol. 17 (Feb.2012), S. 157-163
  • C. Kontis, C. Küchenmeister, M. Müller, K. Kallis and J. Knoch, „Optimizing the identification of mono- and bilayer graphene on multilayer substrates“, In: Applied Optics, Vol. 51, Issue 3 (Jan. 2012), S. 385-389
  • K. T. Kallis, J. T. Horstmann, C. Küchenmeister, L. O. Keller and H. L. Fiedler
    „Enhanced lithography independent MOSFET-fabrication on bulk silicon with sub-50 nm-dimensions“, Transactions on Systems, Signals & Devices, Issues on Sensors, Circuits & Instrumentation Systems, Vol. 5, No. 4 (Dec. 2011)
  • K. T. Kallis, L. O. Keller, C. Küchenmeister, J. T. Horstmann, J. Knoch and H. L. Fiedler, „Nanofin based filaments for sensor applications“, Proceedings of the 36th International Conference on Micro- and Nano-Engineering (MNE), In: Microelectronic Engineering, Volume 88, Issue 8 (August 2011), Pages 2290-2293
  • J. T. Horstmann, K. T. Kallis and H. L. Fiedler
    „Reliability and Electrical Parameter Fluctuations of sub-50nm MOS-Transistors“
    In: Micromaterials and Nanomaterials 12 (2010), pp. 32-38, ISSN 1619-2486
  • R. R. Poloczek, K. T. Kallis, L. O. Keller and H. L. Fiedler
    „A new cost-effective Method of Planarisation for Multiple Metal Layers in the Sub-100 nm-Region“ In: Journal of Nanoscience and Nanotechnology, Volume 10, Number 9 (2010), S. 6046-6048
  • A. Olivares, J.M. Górriz, G. Olivares, J. Ramírez, P. Glösekötter: „A Study of Vibration-Based Energy Harvesting in Activities of Daily Living“, published at 4th International ICST Conference on Pervasive Computing Technologies for Healthcare, Munich, Germany, March 2010
  • L. O. Keller, K. T. Kallis, R. R. Poloczek and H. L. Fiedler, „Nano-Fin based Mercury-Sensor for environmental surveillance“, In: Journal of Nanoscience and Nanotechnology, Volume 10, Number 9 (2010), S. 5921-5925
  • K. T. Kallis, “Lithographieunabhängige, nanoskalige MOS-Technologie“, Münster: Theophano Verlag 2009, ISBN-Nr. 978-3-9809338-6-5
  • K. T. Kallis, L. O. Keller and H. L. Fiedler, „An advanced LOCOS-Process for the Sub-50 nm-Region using Low-Stress PECVD-Silicon Nitrides“, In: Journal of Nano Research Volume 6 (2009), S. 24-27
  • S. Brabender, K. T. Kallis, L. O. Keller and H. L. Fiedler, „Optimization of reactive ion etching processes using desirability“, Proceedings of the 35th International Conference on Micro and Nanoengineering, MNE’09, Ghent, Belgium 2009,
    Sept. 28 – Oct. 01, S. 1413-1415
  • J. T. Horstmann, K. T. Kallis and H. L. Fiedler, „Experimental Threshold Voltage Fluctuations of 30 nm-NMOS-Transistors Manufactured by a Lithography Independent Structure Definition Process“, Proceedings of the 34th International Conference on Micro- and Nanoengineering (MNE’08), Athen 2008, Sept. 15-18, pp. 1054-1056
  • K. T. Kallis, J. T. Horstmann and H. L. Fiedler, “ Lithography Independent High Accuracy Fabrication and Characterization of Next Generation Nano-MOS-Transistors with L=25 nm and W=75 nm „,Proceedings of the 32nd International Conference on Micro and Nanoengineering ( MNE’06), Barcelona 2007, Sept. 17-20, pp 1484-1487
  • K. Goser, P. Glösekötter, J. Dienstuhl: Nanoelektronik und Nanosysteme: Von Transistoren zu Molekular- und Quantenbauelementen, Chinesische Ausgabe, ISBN 7-5605-2178-9, Verlag: Xi’an Jiaotong University Press, 2006
  • K. T. Kallis, J. T. Horstmann, A. Wiggershaus and H. L. Fiedler, „Manufacturing Considerations of Lithography Independent Nano-MOS-Transistors in the sub-25 nm-region“, Proceedings of the 8th International Conference on Solid-State and Integrated Circuit Technology, Shanghai 2006, October, pp 55-57, IEEE Catalog Number: 06EX1294
  • W. Duengen, R. Job, T. Mueller, Y. Ma and W. R. Fahrner (FU Hagen), L. O. Keller, J. T. Horstmann and H. L. Fiedler (TU Dortmund) , „Blistering of implanted crystalline silicon by plasma hydrogenation investigated by Raman scattering spectroscopy“
    In: Journal of Applied Physics 100 (2006), S.124906
  • W. Duengen, R. Job, T. Mueller, Y. Ma, Y. L. Huang and W. R. Fahrner (FU Hagen), L. O. Keller, J. T. Horstmann and H. L. Fiedler (TU Dortmund) „Thermal Evolution of Hydrogen Related Defects in Hydrogen Implanted Czochralski Silicon Investigated by Raman Spectroscopy and Atmoic Force Microscopy“, In: Journal of Applied Physics 100 (2006), S.034911 (5 Seiten)
  • C. Horst, K. T. Kallis, J. T. Horstmann and H. L. Fiedler
    „CMOS Compatible Fabrication Technique for Nano-Transistors by Conventional Optical Lithography“, In: Journal of Semiconductor Technology and Science, Volume 4, Number 1 (2004)
  • K. Goser, P. Glösekötter, J. Dienstuhl: Nanoelectronics and Nanosystems – From Transistors to Molecular and Quantum Devices, ISBN 3-540-40443-0, 2004, Springer-Verlag Berlin Heidelberg New York
  • P. Glösekötter, W. Prost, C. Pacha, S.O. Kim, H. van Husen, T. Reimann, F.-J. Tegude, K.F. Goser: Circuit and Application Asepects of Tunneling Devices in a MOBILE configuration, Special Issue of the International Journal of Circuit Theory and Applications „Nanoelectronic Circuit“, Appl. 2003; 31:83-103 (invited paper)
  • C. Horst, K. T. Kallis, J. T. Horstmann and K. F. Goser, „Lithography-independent fabrication of nano-MOS-transistors with W = 25 nm and L = 25 nm“, Fifth International Symposium on Instrumentation and Control Technology, Oct. 24 – 27, 2003, Proc. SPIE, Vol. 5253 (2003), pp. 223-227, ISBN 0-8194-5137-1
  • P. Glösekötter, W. Prost, C. Pacha, S.O. Kim, H. van Husen, T. Reimann, F.-J. Tegude, K.F. Goser: Pseudo Dynamic Gate Design based on the Resonant-Tunneling-Bipolar-Transistor (RTBT), published on the 32nd European Solid-State Device Research Conference (ESSDERC), Florence, Italy, Sept. 24-26, 2002
  • J. A. Weima, A. M. Zaitsev, R. Job, G. Kosaca, F. Blum, G. Grabosch, W. R. Fahrner, and J. Knopp „Investigation of non-diamond carbon phases and optical centers in thermochemically polished CVD diamond films“, J. Solid State Electrochem., 4 (8) (2000), p. 425
  • C. Pacha, U. Auer, C. Burwick, P. Glösekötter, A. Brennemann, W. Prost, F.J. Tegude and K.F. Goser: Thresold Logic Circuit Design of Parallel Adders Using Resonant Tunneling Devices, IEEE Transactions on Very Larg Scale Integration (VLSI) Systems, October, 2000, pp. 558-572
  • J. A. Weima, R. Job, W. R. Fahrner, and A. M. Zaitsev, „Low energy carbonaceous and graphite phases on the surfaces of thermochemically polished CVD diamond films“, J. Appl. Phys., 87, (2000), p. 4553
  • C. Pacha, O. Kessler, P. Glösekötter, K.F. Goser, W. Prost, A. Brennemann, U. Auer and F.J. Tegude: Parallel Adder Design with Reduced Circuit Complexity Using Resonant Tunneling Transistors and Threshold Logic, Analog Integrated Circuits and Signal Processing, 24, 7 – 25, 2000, Kluwer Academic Publishers.
  • J. A. Weima, W. R. Fahrner, and R. Job, „Experimental investigation of the parameter dependency of the removal rate of thermochemically polished CVD diamond films“, J. Solid State Electrochem., 5 (2) (2001), p. 112
  • R. Job, J. A. Weima, G. Grabosch, D. Borchert, W. R. Fahrner, V. Raiko, and A. G. Ulyashin, „Rapid low temperature diode fabrication on p-type czochralski silicon on the base of simple hydrogen enhanced thermal donor formation processes“ J. solid state phenomena, 69-70 (1999) p. 551
  • J. A. Weima, R. Job, W. R. Fahrner, and G. C. Kosaca, „Surface Analysis of ultra-precise polished CVD diamond films using spectroscopic and microscopic techniques“, J. Appl. Phys., 89 (2001) p. 2434
  • J. A. Weima, J. von Borany, U. Kreissig, and W. R. Fahrner, „Qualitative analysis of carbon distribution in steel used for thermochemical polishing of diamond films“, Journal of The Electrochemical Society, 148 (11) G607-G610 (2001)
  • J. A. Weima, J. von Borany, R. Grözschel and W. R. Fahrner, „Investigating contaminants on thermochemically refined surfaces of CVD diamond films“ [Accepted for publication by Journal of The Electrochemical Society, NJ, ]
  • J. A. Weima, R. Job and W. R. Fahrner „Thermochemical beveling of CVD diamond films intended for precision cutting and measurement applications“ [Accepted for publication by the Journal of Diamond and Related Materials]
  • J. A. Weima, W. R. Fahrner, J. von Borany and R. Job, „A model of the thermochemical polishing of CVD diamond films on transition metals with emphasis on steel“ [Submitted to Journal of Apply Physics]
  • J. A. Weima, J. von Borany, K. Meusinger, J. Horstmann, W. R. Fahrner, “ Double injection of charge carriers in CVD diamond-based diodes [Submitted for publication to J. Appl. Phys.]
  • J. A. Weima, J. von Borany, K. Meusinger, J. Horstmann, W. R. Fahrner, “ A comparative study of the I-V characteristics of diodes fabricated on as-grown and thermochemically polished CVD diamond films [Submitted for publication to Diamond and Related Materials]
  • J. A. Weima, J. von Borany, K. Meusinger, W. R. Fahrner, „Room temperature electroluminescence of CVD diamond-based diodes [Submitted for publication to Diamond and Related Materials]