{"id":195,"date":"2013-07-01T13:33:32","date_gmt":"2013-07-01T11:33:32","guid":{"rendered":"http:\/\/wihmo.de\/nanotech\/?page_id=195"},"modified":"2015-08-24T10:26:52","modified_gmt":"2015-08-24T08:26:52","slug":"conferences-and-presentations","status":"publish","type":"page","link":"https:\/\/nanotech-nrw.de\/?page_id=195","title":{"rendered":"Konferenzen und Pr\u00e4sentationen"},"content":{"rendered":"<ul>\n<li>U. Hilleringmann, R. Job, U. Witkowski, G. Wirth, &#8222;4th Summer School of Advanced Microsystems Technologies for Sensor Applications&#8220;, Universidade Federal do Rio Grande do Sul (UFRGS) July 12th-29th, 2015, Porto Alegre, Brazil <a href=\"https:\/\/nanotech-nrw.de\/wp-content\/uploads\/2013\/07\/Werbeplakat-2015.pdf\">Werbeplakat-2015<\/a><\/li>\n<li><b>K. T. Kallis, V. V. Vendt, C. K\u00fcchenmeister and H. L. Fiedler,<b> <\/b><\/b>&#8222;Nanoscale thermal time of flight sensors&#8220;, 37th International Conference on Micro- and Nanoengineering (MNE&#8217;11), Berlin, Germany 2011, Sept. 19-23<\/li>\n<li><b>C. M. Zimmer, M. Kieschnick, K. T. Kallis, J. Schubert, U. Kunze, T. Doll<b>, <\/b><\/b>&#8222;Nano photoelectron ioniser chip using LaB6 for ambient pressure trace gas detection&#8220;, 37th International Conference on Micro- and Nanoengineering (MNE&#8217;11), Berlin, Germany 2011, Sept. 19-23<\/li>\n<li>S. Brabender, K. T. Kallis, C. Kontis and H. L. Fiedler, &#8222;Low temperature PECVD-SiO2 on germanium&#8220;, 37th International Conference on Micro- and Nanoengineering (MNE&#8217;11), Berlin, Germany 2011, Sept. 19-23<\/li>\n<li>R<b>. Poloczek, P. Filusch, K. T. Kallis and H. L. Fiedler, <\/b>&#8222;Manufacturing of cavities with monocrystalline silicon membranes for pressure sensors using annealing forming gas procedures&#8220;, 37th International Conference on Micro- and Nanoengineering (MNE&#8217;11), Berlin, Germany 2011, Sept. 19-23<\/li>\n<li>K. T. Kallis, J. T. Horstmann and H. L. Fiedler,&#8220;Parameter fluctuations in multiple patterned deca-nm scaled CMOS structures&#8220;, 3rd International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Crete, Greece 2011, July 26-29<\/li>\n<li>K. T. Kallis, L. O. Keller, C. K\u00fcchenmeister, J. T. Horstmann, J. Knoch and H. L. Fiedler, \u201eNanofin based filaments for sensor applications\u201c, 36th International Conference on Micro- and Nanoengineering (MNE\u201910), Genoa, Italy 2010, Sept. 19-22<\/li>\n<li><b>L. O. Keller, K. T. Kallis, H. L. Fiedler and J. Knoch, <\/b>&#8222;A design consideration for a new nano-fin based Mercury-sensor&#8220;, Spanish Conference on Electron Devices, 2009<\/li>\n<li><b>K. T. Kallis and J. T. Horstmann, <\/b>\u201eParameter fluctuations on lithography independent nanowire MOSFETs on bulk silicon&#8220;, 2nd International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Rhodes, Greece 2009, June 28 &#8211; July 03<\/li>\n<li>R. R. Poloczek, K. T. Kallis, L. O. Keller, S. Brabender and H. L. Fiedler, \u201eMultiple Nanolayers for optimal membrane stiffness in integrated high pressure sensors\u201c, 2nd International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Rhodes, Greece 2009 , June 28 -July 03<\/li>\n<li>K. T. Kallis, J. T. Horstmann, C. K\u00fcchenmeister, L. O. Keller and H. L. Fiedler, \u201eCost-Effective MOSFET-Transistors on Bulk Silicon in the Deep Sub-50 nm-Region\u201c, 6th International Multi-Conference on Systems, Signals and Devices (SSD&#8217;09), Djerba, Tunisia 2009, March 23-26, Tagungsband: IEEE Press ISBN 978-9973-959-16-8<\/li>\n<li>P. Gl\u00f6sek\u00f6tter: From Transistors to Molecular and Quantum Devices?, invited TechTalk on Information Processing Technologies at Intel Corp. Braunschweig, Germany, September 18, 2009<\/li>\n<li>L. O. Keller, K. T. Kallis, H. L. Fiedler and J. Knoch, \u201eTowards Nano-Fin based Mercury Sensors\u201c, 7th Spanish Conference on Electron Devices, 2009<\/li>\n<li><b>K. T. Kallis, L. O. Keller and H. L. Fiedler, <\/b>&#8222;Method for Local Oxidation in the Sub-50 nm-Region&#8220;, 34th International Conference on Micro and Nanoengineering, MNE\u201908, Athen 2008, Sept. 15-18<\/li>\n<li>V. Camargo, M. da Silva, L. Brusamarello, G. Wirth, P. Gl\u00f6sek\u00f6tter: Modeling the Impact of NBTI on the Reliability of Arithmetic Circuits, published at CHIP IN THE PAMPA SBCCI, September 1-4, 2008, SFORUM2008<\/li>\n<li>P. Gl\u00f6sek\u00f6tter, U. Greveler, G. I. Wirth: Device Degradation and Resilient Computing, published at the 2008 IEEE International Symposium on Circuits and Systems in Seattle, USA, May 18-21, 2008<\/li>\n<li>P. Gl\u00f6sek\u00f6tter, M. Berekovic, G. I. Wirth: NBTI Degradation and Resilient Circuit Design, Workshop on Impact of Process Variability on Design and Test, held at Design, Automation and Test in Europe Conference (DATE 2008), Munich, March 10-14, 2008<\/li>\n<li><b>K. T. Kallis, L. O. Keller and H. L. Fiedler, <\/b>&#8222;An advanced LOCOS-Process for the Sub-50 nm-Region using Low-Stress PECVD-Silicon Nitrides&#8220;,1st International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Porto Carras, Greece 2008<\/li>\n<li>L. O. Keller, K. T. Kallis and H. L. Fiedler, &#8222;Nano-Fin based Mercury-Sensor for environmental surveillance&#8220;, 1st International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Porto Carras, Greece 2008<\/li>\n<li><b>R. R. Poloczeck, L. O. Keller, K. T. Kallis and H. L. Fiedler, <\/b>&#8222;A new cost-effective Method of Planarisation for Multiple Metal Layers in the Sub-100 nm-Region&#8220;, 1st International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Porto Carras, Greece 2008<\/li>\n<li>K. U. Harms and J. T. Horstmann, &#8222;CMOS-compatible fabrication of an electrostatic driven surface MEMS switch for RF-applications&#8220;, Micro and Nano Engineering (MNE 2003), Cambridge, UK 2003, pp. 296-297<\/li>\n<li><b>K. U. Harms, L. O. Keller and J. T. Horstmann, <\/b>&#8222;CMOS-kompatible Herstellung eines elektrostatisch angetriebenen Oberfl\u00e4chen-MEMS-Schalters f\u00fcr RF-Anwendungen&#8220;, 5. Chemnitzer Fachtagung Mikromechanik &amp; Mikroelektronik, 6 (2003), Seite 213-217C. Horst,<\/li>\n<li>K. T. Kallis and J. T. Horstmann, &#8222;Lithographieunabh\u00e4ngige Fertigung von MOS-Transistoren im sub-100 nm-Bereich&#8220;, 15. Informationstagung Mikroelektronik, Wien 2003, pp. 47-52<\/li>\n<li>1. J. A. Weima, A. M. Zaitsev, R. Job, G. Kosaca, F. Blum, G. Grabosch, W. R. Fahrner, and J. Knopp, &#8222;Nano-polishing and subsequent optical characterization of CVD polycrystalline CVD diamond films&#8220;, [Iecon&#8217;99 San Jose, California, USA; 29th Nov.-3 Dec. 1999] The 25th Annual Conference of the IEEE Industrial Electronics Society, p.50-55, ISBN 0-7803-5735-3.<\/li>\n<li>2. J. A. Weima, W. R. Fahrner, A. M. Zaitsev, F. Blum, and G. C. Kosaca, &#8222;Surface characterization of thermochemically polished CVD diamond films&#8220;, [Micromaterials (MicroMat 2000) Berlin, April 17th -19th 2000] Abstracts: 3rd International Conference and Poster Exhibition, p. 410, ISBN 3-932434-14-5. Proceedings: 3rd International Conference and Poster Exhibition, p. 880-883, ISBN 3-932434-15-3.<\/li>\n<li>3. J. A. Weima, R. Job, and W. R. Fahrner, &#8222;Nano-degradation of diamond surfaces by the thermochemical polishing technique&#8220;, The 26th Annual Conference of the IEEE Industrial Electronics Society, Iecon&#8217;2000 Nagoya, Japan, October 22nd-28th 2000, p.1856-61, ISBN 0-7803-6456-2, IEEE Cat. No. 00CH37141C.<\/li>\n<li>4. J . A. Weima, W. R. Fahrner, R. Job, and A. M. Zaitsev, &#8222;Optical examination of the surfaces of thermochemically polished CVD diamond films&#8220;, [DPG Regensburg, March 27th-31st 2000] New Journal of physics. An Institute of Physics &amp; Deutsche Physikalische Gesellschaft Journal, ISSN 0420-0196, p 505<\/li>\n<li>5. J. A. Weima, R. Job, F. Blum, and W. R. Fahrner, &#8222;The influence of various physical parameters on the removal rate of thermochemically polished CVD diamond films&#8220; [DPG Regensburg, March 27th-31st 2000] New Journal of physics. An Institute of Physics &amp; Deutsche Physikalische Gesellschaft Journal, ISSN 0420-0196, p 507<\/li>\n<li>6. J. A. Weima, A. M. Zaitsev, W. R. Fahrner, R. Job, G. C. Kosaca, and F. Blum, &#8222;Non-diamond carbon phases on the surfaces of transition metal enhanced polished CVD diamond films&#8220;, [DPG Regensburg, March 27th -31st 2000] New Journal of physics. An Institute of Physics &amp; Deutsche Physikalische Gesellschaft Journal, ISSN 0420-0196, p 507<\/li>\n<li>7. F. Blum, J. A. Weima, G. C. Kosaca, and W. R. Fahrner &#8222;Implanted pressure sensors on CVD diamond films&#8220;, [Micromaterials (MicroMat 2000) Berlin, April 17th -19th 2000] Abstracts: 3rd International Conference and Poster Exhibition, p. 47, ISBN 3-932434-14-5.<\/li>\n<li>8. G. C. Kosaca, F. Blum, J. A. Weima, and W. R. Fahrner, &#8222;Characterization of gated p-i-p-structures on CVD diamond films and natural crystals&#8220;, [Micromaterials (MicroMat 2000) Berlin, April 17th -19th 2000] Abstracts: 3rd International Conference and Poster Exhibition, p. 199, ISBN 3-932434-14-5.<\/li>\n<li>9. J. A. Weima, W. R. Fahrner, &#8222;Thermochemical Refinement of the surfaces of artificially produced diamond films&#8220;, [Seminal presentation at the Research Center in Rossendorf, Dresden 5th July 2000].<\/li>\n<li>10. J. A. Weima, J. von Borany, and W. R. Fahrner, &#8222;Analysis of steel-diamond surfaces after high temperature thermochemical polishing&#8220;, (DPG-Hamburg; 65. Physikertagung Hamburg, 26th &#8211; 30th March 2001 (AKF-Fr\u00fchjahrtagung), p. 177, ISSN 0420-0195)<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>U. Hilleringmann, R. Job, U. Witkowski, G. Wirth, &#8222;4th Summer School of Advanced Microsystems Technologies for Sensor Applications&#8220;, Universidade Federal do Rio Grande do Sul (UFRGS) July 12th-29th, 2015, Porto Alegre, Brazil Werbeplakat-2015 K. T. Kallis, V. V. Vendt, C. &hellip; <a href=\"https:\/\/nanotech-nrw.de\/?page_id=195\">Weiterlesen <span class=\"meta-nav\">&rarr;<\/span><\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-195","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/nanotech-nrw.de\/index.php?rest_route=\/wp\/v2\/pages\/195","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanotech-nrw.de\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/nanotech-nrw.de\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/nanotech-nrw.de\/index.php?rest_route=\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/nanotech-nrw.de\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=195"}],"version-history":[{"count":10,"href":"https:\/\/nanotech-nrw.de\/index.php?rest_route=\/wp\/v2\/pages\/195\/revisions"}],"predecessor-version":[{"id":210,"href":"https:\/\/nanotech-nrw.de\/index.php?rest_route=\/wp\/v2\/pages\/195\/revisions\/210"}],"wp:attachment":[{"href":"https:\/\/nanotech-nrw.de\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=195"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}