Konferenzen und Präsentationen

  • U. Hilleringmann, R. Job, U. Witkowski, G. Wirth, „4th Summer School of Advanced Microsystems Technologies for Sensor Applications“, Universidade Federal do Rio Grande do Sul (UFRGS) July 12th-29th, 2015, Porto Alegre, Brazil Werbeplakat-2015
  • K. T. Kallis, V. V. Vendt, C. Küchenmeister and H. L. Fiedler, „Nanoscale thermal time of flight sensors“, 37th International Conference on Micro- and Nanoengineering (MNE’11), Berlin, Germany 2011, Sept. 19-23
  • C. M. Zimmer, M. Kieschnick, K. T. Kallis, J. Schubert, U. Kunze, T. Doll, „Nano photoelectron ioniser chip using LaB6 for ambient pressure trace gas detection“, 37th International Conference on Micro- and Nanoengineering (MNE’11), Berlin, Germany 2011, Sept. 19-23
  • S. Brabender, K. T. Kallis, C. Kontis and H. L. Fiedler, „Low temperature PECVD-SiO2 on germanium“, 37th International Conference on Micro- and Nanoengineering (MNE’11), Berlin, Germany 2011, Sept. 19-23
  • R. Poloczek, P. Filusch, K. T. Kallis and H. L. Fiedler, „Manufacturing of cavities with monocrystalline silicon membranes for pressure sensors using annealing forming gas procedures“, 37th International Conference on Micro- and Nanoengineering (MNE’11), Berlin, Germany 2011, Sept. 19-23
  • K. T. Kallis, J. T. Horstmann and H. L. Fiedler,“Parameter fluctuations in multiple patterned deca-nm scaled CMOS structures“, 3rd International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Crete, Greece 2011, July 26-29
  • K. T. Kallis, L. O. Keller, C. Küchenmeister, J. T. Horstmann, J. Knoch and H. L. Fiedler, „Nanofin based filaments for sensor applications“, 36th International Conference on Micro- and Nanoengineering (MNE’10), Genoa, Italy 2010, Sept. 19-22
  • L. O. Keller, K. T. Kallis, H. L. Fiedler and J. Knoch, „A design consideration for a new nano-fin based Mercury-sensor“, Spanish Conference on Electron Devices, 2009
  • K. T. Kallis and J. T. Horstmann, „Parameter fluctuations on lithography independent nanowire MOSFETs on bulk silicon“, 2nd International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Rhodes, Greece 2009, June 28 – July 03
  • R. R. Poloczek, K. T. Kallis, L. O. Keller, S. Brabender and H. L. Fiedler, „Multiple Nanolayers for optimal membrane stiffness in integrated high pressure sensors“, 2nd International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Rhodes, Greece 2009 , June 28 -July 03
  • K. T. Kallis, J. T. Horstmann, C. Küchenmeister, L. O. Keller and H. L. Fiedler, „Cost-Effective MOSFET-Transistors on Bulk Silicon in the Deep Sub-50 nm-Region“, 6th International Multi-Conference on Systems, Signals and Devices (SSD’09), Djerba, Tunisia 2009, March 23-26, Tagungsband: IEEE Press ISBN 978-9973-959-16-8
  • P. Glösekötter: From Transistors to Molecular and Quantum Devices?, invited TechTalk on Information Processing Technologies at Intel Corp. Braunschweig, Germany, September 18, 2009
  • L. O. Keller, K. T. Kallis, H. L. Fiedler and J. Knoch, „Towards Nano-Fin based Mercury Sensors“, 7th Spanish Conference on Electron Devices, 2009
  • K. T. Kallis, L. O. Keller and H. L. Fiedler, „Method for Local Oxidation in the Sub-50 nm-Region“, 34th International Conference on Micro and Nanoengineering, MNE’08, Athen 2008, Sept. 15-18
  • V. Camargo, M. da Silva, L. Brusamarello, G. Wirth, P. Glösekötter: Modeling the Impact of NBTI on the Reliability of Arithmetic Circuits, published at CHIP IN THE PAMPA SBCCI, September 1-4, 2008, SFORUM2008
  • P. Glösekötter, U. Greveler, G. I. Wirth: Device Degradation and Resilient Computing, published at the 2008 IEEE International Symposium on Circuits and Systems in Seattle, USA, May 18-21, 2008
  • P. Glösekötter, M. Berekovic, G. I. Wirth: NBTI Degradation and Resilient Circuit Design, Workshop on Impact of Process Variability on Design and Test, held at Design, Automation and Test in Europe Conference (DATE 2008), Munich, March 10-14, 2008
  • K. T. Kallis, L. O. Keller and H. L. Fiedler, „An advanced LOCOS-Process for the Sub-50 nm-Region using Low-Stress PECVD-Silicon Nitrides“,1st International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Porto Carras, Greece 2008
  • L. O. Keller, K. T. Kallis and H. L. Fiedler, „Nano-Fin based Mercury-Sensor for environmental surveillance“, 1st International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Porto Carras, Greece 2008
  • R. R. Poloczeck, L. O. Keller, K. T. Kallis and H. L. Fiedler, „A new cost-effective Method of Planarisation for Multiple Metal Layers in the Sub-100 nm-Region“, 1st International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems, Porto Carras, Greece 2008
  • K. U. Harms and J. T. Horstmann, „CMOS-compatible fabrication of an electrostatic driven surface MEMS switch for RF-applications“, Micro and Nano Engineering (MNE 2003), Cambridge, UK 2003, pp. 296-297
  • K. U. Harms, L. O. Keller and J. T. Horstmann, „CMOS-kompatible Herstellung eines elektrostatisch angetriebenen Oberflächen-MEMS-Schalters für RF-Anwendungen“, 5. Chemnitzer Fachtagung Mikromechanik & Mikroelektronik, 6 (2003), Seite 213-217C. Horst,
  • K. T. Kallis and J. T. Horstmann, „Lithographieunabhängige Fertigung von MOS-Transistoren im sub-100 nm-Bereich“, 15. Informationstagung Mikroelektronik, Wien 2003, pp. 47-52
  • 1. J. A. Weima, A. M. Zaitsev, R. Job, G. Kosaca, F. Blum, G. Grabosch, W. R. Fahrner, and J. Knopp, „Nano-polishing and subsequent optical characterization of CVD polycrystalline CVD diamond films“, [Iecon’99 San Jose, California, USA; 29th Nov.-3 Dec. 1999] The 25th Annual Conference of the IEEE Industrial Electronics Society, p.50-55, ISBN 0-7803-5735-3.
  • 2. J. A. Weima, W. R. Fahrner, A. M. Zaitsev, F. Blum, and G. C. Kosaca, „Surface characterization of thermochemically polished CVD diamond films“, [Micromaterials (MicroMat 2000) Berlin, April 17th -19th 2000] Abstracts: 3rd International Conference and Poster Exhibition, p. 410, ISBN 3-932434-14-5. Proceedings: 3rd International Conference and Poster Exhibition, p. 880-883, ISBN 3-932434-15-3.
  • 3. J. A. Weima, R. Job, and W. R. Fahrner, „Nano-degradation of diamond surfaces by the thermochemical polishing technique“, The 26th Annual Conference of the IEEE Industrial Electronics Society, Iecon’2000 Nagoya, Japan, October 22nd-28th 2000, p.1856-61, ISBN 0-7803-6456-2, IEEE Cat. No. 00CH37141C.
  • 4. J . A. Weima, W. R. Fahrner, R. Job, and A. M. Zaitsev, „Optical examination of the surfaces of thermochemically polished CVD diamond films“, [DPG Regensburg, March 27th-31st 2000] New Journal of physics. An Institute of Physics & Deutsche Physikalische Gesellschaft Journal, ISSN 0420-0196, p 505
  • 5. J. A. Weima, R. Job, F. Blum, and W. R. Fahrner, „The influence of various physical parameters on the removal rate of thermochemically polished CVD diamond films“ [DPG Regensburg, March 27th-31st 2000] New Journal of physics. An Institute of Physics & Deutsche Physikalische Gesellschaft Journal, ISSN 0420-0196, p 507
  • 6. J. A. Weima, A. M. Zaitsev, W. R. Fahrner, R. Job, G. C. Kosaca, and F. Blum, „Non-diamond carbon phases on the surfaces of transition metal enhanced polished CVD diamond films“, [DPG Regensburg, March 27th -31st 2000] New Journal of physics. An Institute of Physics & Deutsche Physikalische Gesellschaft Journal, ISSN 0420-0196, p 507
  • 7. F. Blum, J. A. Weima, G. C. Kosaca, and W. R. Fahrner „Implanted pressure sensors on CVD diamond films“, [Micromaterials (MicroMat 2000) Berlin, April 17th -19th 2000] Abstracts: 3rd International Conference and Poster Exhibition, p. 47, ISBN 3-932434-14-5.
  • 8. G. C. Kosaca, F. Blum, J. A. Weima, and W. R. Fahrner, „Characterization of gated p-i-p-structures on CVD diamond films and natural crystals“, [Micromaterials (MicroMat 2000) Berlin, April 17th -19th 2000] Abstracts: 3rd International Conference and Poster Exhibition, p. 199, ISBN 3-932434-14-5.
  • 9. J. A. Weima, W. R. Fahrner, „Thermochemical Refinement of the surfaces of artificially produced diamond films“, [Seminal presentation at the Research Center in Rossendorf, Dresden 5th July 2000].
  • 10. J. A. Weima, J. von Borany, and W. R. Fahrner, „Analysis of steel-diamond surfaces after high temperature thermochemical polishing“, (DPG-Hamburg; 65. Physikertagung Hamburg, 26th – 30th March 2001 (AKF-Frühjahrtagung), p. 177, ISSN 0420-0195)